"Capture-Pattern-Control to Address the Fault Detection Degradation Problem ..."

Senling Wang et al. (2018)

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DOI: 10.1109/ATS.2018.00038

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Senling Wang, Tomoki Aono, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima:
Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST. ATS 2018: 155-160

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