"Testable Design and Testing of MCMs Based on Multifrequency Scan."

Wang-Dauh Tseng, Kuochen Wang (1996)

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DOI: 10.1109/ATS.1996.555140

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Wang-Dauh Tseng, Kuochen Wang:
Testable Design and Testing of MCMs Based on Multifrequency Scan. Asian Test Symposium 1996: 75-

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