"Optimal Seed Generation for Delay Fault Detection BIST."

Lihong Tong, Kazuki Suzuki, Hideo Ito (2002)

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DOI: 10.1109/ATS.2002.1181697

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Lihong Tong, Kazuki Suzuki, Hideo Ito:
Optimal Seed Generation for Delay Fault Detection BIST. Asian Test Symposium 2002: 116-121

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