"Test Generation of Path Delay Faults Induced by Defects in Power TSV."

Chi-Jih Shih et al. (2013)

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DOI: 10.1109/ATS.2013.18

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Chi-Jih Shih, Shih-An Hsieh, Yi-Chang Lu, James Chien-Mo Li, Tzong-Lin Wu, Krishnendu Chakrabarty:
Test Generation of Path Delay Faults Induced by Defects in Power TSV. Asian Test Symposium 2013: 43-48

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