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Shih-An Hsieh

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2010 – 2019

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2019
[j1]
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  - journals/tcad/HsiehWSHPCL19
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  - https://dblp.org/rec/journals/tcad/HsiehWSHPCL19
Shih-An Hsieh, Ying-Hsu Wang, Ting-Yu Shen, Kuan-Yen Huang, Chia-Cheng Pai, Tsai-Chieh Chen, James Chien-Mo Li:
DR-Scan: Dual-Rail Asynchronous Scan DfT and ATPG. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(1): 136-148 (2019)
2013
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Chi-Jih Shih, Shih-An Hsieh, Yi-Chang Lu, James Chien-Mo Li, Tzong-Lin Wu, Krishnendu Chakrabarty:
Test Generation of Path Delay Faults Induced by Defects in Power TSV. Asian Test Symposium 2013: 43-48

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