"Distinguishing Resistive Small Delay Defects from Random Parameter Variations."

Xi Qian, Adit D. Singh (2010)

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DOI: 10.1109/ATS.2010.62

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Xi Qian, Adit D. Singh:
Distinguishing Resistive Small Delay Defects from Random Parameter Variations. Asian Test Symposium 2010: 325-330

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