"TestExpress - New Time-Effective Scan-Based Deterministic Test Paradigm."

Grzegorz Mrugalski et al. (2015)

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DOI: 10.1109/ATS.2015.11

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Grzegorz Mrugalski, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Chen Wang:
TestExpress - New Time-Effective Scan-Based Deterministic Test Paradigm. ATS 2015: 19-24

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