"Modified Scan Flip-Flop for Low Power Testing."

Amit Mishra et al. (2010)

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DOI: 10.1109/ATS.2010.69

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Amit Mishra, Nidhi Sinha, Satdev, Virendra Singh, Sreejit Chakravarty, Adit D. Singh:
Modified Scan Flip-Flop for Low Power Testing. Asian Test Symposium 2010: 367-370

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