"Is IDDQ testing not applicable for deep submicron VLSI in year 2011?"

Chih-Wen Lu et al. (2000)

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DOI: 10.1109/ATS.2000.893646

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Chih-Wen Lu, Chauchin Su, Chung-Len Lee, Jwu E. Chen:
Is IDDQ testing not applicable for deep submicron VLSI in year 2011? Asian Test Symposium 2000: 338-343

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