"A Multi-dimensional Pattern Run-Length Method for Test Data Compression."

Lung-Jen Lee et al. (2009)

> Home

Details and statistics

DOI: 10.1109/ATS.2009.49

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/ats/LeeTLL09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ats/LeeTLL09
Lung-Jen Lee, Wang-Dauh Tseng, Rung-Bin Lin, Chen-Lun Lee:
A Multi-dimensional Pattern Run-Length Method for Test Data Compression. Asian Test Symposium 2009: 325-330

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.