"On the Generation of Compact Deterministic Test Sets for BIST Ready Designs."

Amit Kumar et al. (2013)

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DOI: 10.1109/ATS.2013.45

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Amit Kumar, Janusz Rajski, Sudhakar M. Reddy, Thomas Rinderknecht:
On the Generation of Compact Deterministic Test Sets for BIST Ready Designs. Asian Test Symposium 2013: 201-206

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