"A Partially-Exhaustive Gate Transition Fault Model."

Brion L. Keller et al. (2009)

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DOI: 10.1109/ATS.2009.62

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Brion L. Keller, Dale Meehl, Anis Uzzaman, Richard Billings:
A Partially-Exhaustive Gate Transition Fault Model. Asian Test Symposium 2009: 361-364

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