"CMOS Open Defect Detection Based on Supply Current in Time-Variable ..."

Masaki Hashizume et al. (2001)

> Home

Details and statistics

DOI: 10.1109/ATS.2001.990269

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/ats/HashizumeIYT01
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ats/HashizumeIYT01
Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada:
CMOS Open Defect Detection Based on Supply Current in Time-Variable Electric Field and Supply Voltage Application. Asian Test Symposium 2001: 117-122

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.