"Fanout fault analysis for digital logic circuits."

Jwu E. Chen et al. (1995)

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DOI: 10.1109/ATS.1995.485313

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Jwu E. Chen, Chung-Len Lee, Wen-Zen Shen, Beyin Chen:
Fanout fault analysis for digital logic circuits. Asian Test Symposium 1995: 33-39

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