"Cost-Effective TAP-Controlled Serialized Compressed Scan Architecture for ..."

Chen-An Chen et al. (2013)

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DOI: 10.1109/ATS.2013.29

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Chen-An Chen, Yee-Wen Chen, Chun-Lung Hsu, Ming-Hsueh Wu, Kun-Lun Luo, Bing-Chuan Bai, Liang-Chia Cheng:
Cost-Effective TAP-Controlled Serialized Compressed Scan Architecture for 3D Stacked ICs. Asian Test Symposium 2013: 107-108

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