"Efficient Test Architecture based on Boundary Scan for Comprehensive ..."

Tapan J. Chakraborty (2005)

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DOI: 10.1109/ATS.2005.54

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Tapan J. Chakraborty:
Efficient Test Architecture based on Boundary Scan for Comprehensive System Test. Asian Test Symposium 2005: 464-465

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