"A High Performance IDDQ Testable Cache for Scaled CMOS Technologies."

Swarup Bhunia, Hai Li, Kaushik Roy (2002)

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DOI: 10.1109/ATS.2002.1181704

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-07

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Swarup Bhunia, Hai Li, Kaushik Roy:
A High Performance IDDQ Testable Cache for Scaled CMOS Technologies. Asian Test Symposium 2002: 157-

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