"Self Synchronous Circuits for Error Robust Operation in Sub-100nm Processes."

Benjamin Stefan Devlin, Makoto Ikeda, Kunihiro Asada (2012)

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DOI: 10.1109/ASYNC.2012.13

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Benjamin Stefan Devlin, Makoto Ikeda, Kunihiro Asada:
Self Synchronous Circuits for Error Robust Operation in Sub-100nm Processes. ASYNC 2012: 150-157

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