"TEPD: A Compound Timing Detection of Both Data-Transition and ..."

Zhengguo Shen et al. (2023)

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DOI: 10.1109/A-SSCC58667.2023.10348009

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-27

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Zhengguo Shen, Junyi Qian, Keran Li, Ziyu Li, Lishuo Deng, Weiwei Shan:
TEPD: A Compound Timing Detection of Both Data-Transition and Path-Activation for Reliable In-Situ Timing Error Detection and Correction in 28nm CMOS. A-SSCC 2023: 1-3

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