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"A leakage-current-recycling phase-locked loop in 65nm CMOS technology."

I-Ting Lee, Yun-Ta Tsai, Shen-Iuan Liu (2011)

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DOI: 10.1109/ASSCC.2011.6123621

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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I-Ting Lee, Yun-Ta Tsai, Shen-Iuan Liu:
A leakage-current-recycling phase-locked loop in 65nm CMOS technology. A-SSCC 2011: 137-140

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