"A 24Gb/s/pin PAM-4 Built Out Tester chip enabling PAM-4 chips test with ..."

Hyungmin Jin et al. (2021)

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DOI: 10.1109/A-SSCC53895.2021.9634750

access: closed

type: Conference or Workshop Paper

metadata version: 2021-12-21

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Hyungmin Jin, Jindo Byun, Hyunyoon Cho, Hojun Yoon, Jin-Hee Park, Kyoungsoo Kim, Youngdon Choi, Jung-Hwan Choi, Hyungjong Ko, Sang-Hyun Lee:
A 24Gb/s/pin PAM-4 Built Out Tester chip enabling PAM-4 chips test with NRZ interface ATE. A-SSCC 2021: 1-3

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