"Device-Aware Test for Anomalous Charge Trapping in FeFETs."

Sicong Yuan et al. (2025)

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DOI: 10.1145/3658617.3697755

access: closed

type: Conference or Workshop Paper

metadata version: 2025-03-07

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Sicong Yuan, Changhao Wang, Moritz Fieback, Hanzhi Xun, Mottaqiallah Taouil, Xiuyan Li, Danyang Chen, Lin Wang, Nicolò Bellarmino, Riccardo Cantoro, Said Hamdioui:
Device-Aware Test for Anomalous Charge Trapping in FeFETs. ASP-DAC 2025: 635-641

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