"Learning Assisted Side Channel Delay Test for Detection of Recycled ICs."

Ashkan Vakil et al. (2021)

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DOI: 10.1145/3394885.3431640

access: closed

type: Conference or Workshop Paper

metadata version: 2021-02-09

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Ashkan Vakil, Farzad Niknia, Ali Mirzaeian, Avesta Sasan, Naghmeh Karimi:
Learning Assisted Side Channel Delay Test for Detection of Recycled ICs. ASP-DAC 2021: 455-462

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