"Signature Driven Post-Manufacture Testing and Tuning of RRAM Spiking ..."

Anurup Saha et al. (2024)

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DOI: 10.1109/ASP-DAC58780.2024.10473874

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-22

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Anurup Saha, Chandramouli N. Amarnath, Kwondo Ma, Abhijit Chatterjee:
Signature Driven Post-Manufacture Testing and Tuning of RRAM Spiking Neural Networks for Yield Recovery. ASPDAC 2024: 740-745

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