"A Dynamic Testing Scheme for Resistive-Based Computation-In-Memory ..."

Sina Bakhtavari Mamaghani, Priyanjana Pal, Mehdi Baradaran Tahoori (2024)

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DOI: 10.1109/ASP-DAC58780.2024.10473815

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-22

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Sina Bakhtavari Mamaghani, Priyanjana Pal, Mehdi Baradaran Tahoori:
A Dynamic Testing Scheme for Resistive-Based Computation-In-Memory Architectures. ASPDAC 2024: 509-514

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