"Guided gate-level ATPG for sequential circuits using a high-level test ..."

Bijan Alizadeh, Masahiro Fujita (2010)

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DOI: 10.1109/ASPDAC.2010.5419843

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Bijan Alizadeh, Masahiro Fujita:
Guided gate-level ATPG for sequential circuits using a high-level test generation approach. ASP-DAC 2010: 425-430

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