"Single Event Transient Reliability Analysis on a Fault-Tolerant RISC-V ..."

Marcello Barbirotta et al. (2023)

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DOI: 10.1007/978-3-031-48121-5_6

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-18

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Marcello Barbirotta, Marco Angioli, Antonio Mastrandrea, Abdallah Cheikh, Saeid Jamili, Francesco Menichelli, Mauro Olivieri:
Single Event Transient Reliability Analysis on a Fault-Tolerant RISC-V Microprocessor Design. ApplePies 2023: 42-48

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