"A Fault Detection Method based on the Deep Extended PCA - SVM in ..."

Chun Yang et al. (2021)

> Home

Details and statistics

DOI: 10.23919/ACC50511.2021.9482824

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/amcc/YangTZGZZF21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/amcc/YangTZGZZF21
Chun Yang, Lujing Tao, Jian Zhang, Xingtai Gui, Jiyang Zhang, Jianxiao Zou, Shicai Fan:
A Fault Detection Method based on the Deep Extended PCA - SVM in Industrial Processes. ACC 2021: 3620-3625

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.