"Long-Term Reliability of Nanometer VLSI Systems, Modeling, Analysis and ..."

Sheldon X.-D. Tan et al. (2019)

> Home

Details and statistics

DOI: 10.1007/978-3-030-26172-6

access: closed

type: Editorship

metadata version: 2021-02-19

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - books/sp/19/TTKWS2019
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/books/sp/19/TTKWS2019
Sheldon X.-D. Tan, Mehdi Baradaran Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr:
Long-Term Reliability of Nanometer VLSI Systems, Modeling, Analysis and Optimization. Springer 2019, ISBN 978-3-030-26171-9

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.