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ORCIDAlberto González 0002
Person information
- affiliation: Delft University of Technology, The Netherlands
Other persons with the same name
- Alberto González 0001
![[0000-0002-6984-3212]](https://dblp.uni-trier.de./img/orcid-mark.12x12.png "0000-0002-6984-3212")
(aka: Alberto González-Salvador) — Technical University of Valencia, Spain - Alberto González 0003 — Navantia, Sydney, NSW, Australia
- Alberto González 0004 — Barcelona Supercomputing Center (BSC), Spain
- Alberto González 0005 — Optare Solutions, Spain
- Alberto González-Sanchez 0001 — Tecnologico de Monterrey, Campus Cuernavaca, Mexico
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2010 – 2019
- 2013
[p3]Éric Piel, Alberto González-Sanchez, Hans-Gerhard Gross, Arjan J. C. van Gemund:
Online Fault Localization and Health Monitoring for Software Systems. Situation Awareness with Systems of Systems 2013: 229-245- [p2]Alberto González-Sanchez, Éric Piel, Rui Abreu, Hans-Gerhard Gross, Arjan J. C. van Gemund:
Prioritizing Tests for Fault Localization. Situation Awareness with Systems of Systems 2013: 247-257 - 2011
- [b1]Alberto González-Sanchez:
Cost Optimizations in Runtime Testing and Diagnosis. Delft University of Technology, Netherlands, 2011 - [j1]Alberto González-Sanchez, Éric Piel, Rui Abreu, Hans-Gerhard Groß, Arjan J. C. van Gemund:
Prioritizing tests for software fault diagnosis. Softw. Pract. Exp. 41(10): 1105-1129 (2011) - [c18]Alberto González-Sanchez, Rui Abreu, Hans-Gerhard Groß, Arjan J. C. van Gemund:
Spectrum-Based Sequential Diagnosis. AAAI 2011: 189-196 - [c17]Alberto González-Sanchez:
Cost Optimizations in Runtime Testing and Diagnosis of Systems of Systems. ICST 2011: 439-442 - [c16]Alberto González-Sanchez, Hans-Gerhard Gross, Arjan J. C. van Gemund:
Modeling the Diagnostic Efficiency of Regression Test Suites. ICST Workshops 2011: 634-643 - [c15]Alberto González-Sanchez, Éric Piel, Hans-Gerhard Gross, Arjan J. C. van Gemund:
A Diagnostic Point of View for the Optimization of Preparation Costs in Runtime Testing. ICST Workshops 2011: 654-660 - [c14]Rui Abreu, Alberto González-Sanchez, Arjan J. C. van Gemund:
A Diagnostic Reasoning Approach to Defect Prediction. IEA/AIE (2) 2011: 416-425 - [c13]Alberto González-Sanchez, Rui Abreu, Hans-Gerhard Gross, Arjan J. C. van Gemund:
Prioritizing tests for fault localization through ambiguity group reduction. ASE 2011: 83-92 - [c12]Alberto González-Sanchez, Rui Abreu, Hans-Gerhard Groß, Arjan J. C. van Gemund:
An empirical study on the usage of testability information to fault localization in software. SAC 2011: 1398-1403 - [c11]Éric Piel, Alberto González-Sanchez, Hans-Gerhard Groß, Arjan J. C. van Gemund:
Spectrum-Based Health Monitoring for Self-Adaptive Systems. SASO 2011: 99-108 - 2010
- [c10]Alberto González-Sanchez, Éric Piel, Hans-Gerhard Groß, Arjan J. C. van Gemund:
Minimising the Preparation Cost of Runtime Testing Based on Testability Metrics. COMPSAC 2010: 419-424 - [c9]Rui Abreu, Alberto González-Sanchez, Arjan J. C. van Gemund:
Exploiting count spectra for Bayesian fault localization. PROMISE 2010: 12 - [c8]Éric Piel, Alberto González-Sanchez, Hans-Gerhard Groß:
Built-In Data-Flow Integration Testing in Large-Scale Component-Based Systems. ICTSS 2010: 79-94 - [c7]Alberto González-Sanchez, Éric Piel, Hans-Gerhard Groß, Arjan J. C. van Gemund:
Prioritizing Tests for Software Fault Localization. QSIC 2010: 42-51 - [p1]Éric Piel, Alberto González-Sanchez, Hans-Gerhard Groß:
Automating Integration Testing of Large-Scale Publish/Subscribe Systems. Principles and Applications of Distributed Event-Based Systems 2010: 140-163
2000 – 2009
- 2009
- [c6]Alberto González, Éric Piel, Hans-Gerhard Gross:
A Model for the Measurement of the Runtime Testability of Component-Based Systems. ICST Workshops 2009: 19-28 - [c5]Alberto González-Sanchez, Éric Piel, Hans-Gerhard Groß:
RiTMO: A Method for Runtime Testability Measurement and Optimisation. QSIC 2009: 377-382 - 2008
- [c4]Rui Abreu, Alberto González, Peter Zoeteweij, Arjan J. C. van Gemund:
Using Fault Screeners for Software Error Detection. ENASE (Selected Papers) 2008: 60-74 - [c3]Rui Abreu, Alberto González-Sanchez, Peter Zoeteweij, Arjan J. C. van Gemund:
On the Performance of Fault Screeners in Software Development and Deployment. ENASE 2008: 123-130 - [c2]Alberto González, Éric Piel, Hans-Gerhard Groß:
Architecture support for runtime integration and verification of component-based Systems of Systems. ASE Workshops 2008: 41-48 - [c1]Rui Abreu, Alberto González, Peter Zoeteweij, Arjan J. C. van Gemund:
Automatic software fault localization using generic program invariants. SAC 2008: 712-717
Coauthor Index
aka: Hans-Gerhard Gross
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