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Eishi Ibe

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Journal Articles

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2003
[j1]
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  - journals/jssc/OsadaSII03
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  - https://dblp.org/rec/journals/jssc/OsadaSII03
Kenichi Osada, Yoshikazu Saitoh, Eishi Ibe, Koichiro Ishibashi:
16.7-fA/cell tunnel-leakage-suppressed 16-Mb SRAM for handling cosmic-ray-induced multierrors. IEEE J. Solid State Circuits 38(11): 1952-1957 (2003)

Conference and Workshop Papers

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2012
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  - conf/iolts/IbeTST12
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Eishi Ibe, Tadanobu Toba, Ken-ichi Shimbo, Hitoshi Taniguchi:
Fault-based reliable design-on-upper-bound of electronic systems for terrestrial radiation including muons, electrons, protons and low energy neutrons. IOLTS 2012: 49-54
2006
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  - conf/cicc/IbeCWYYKYA06
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Eishi Ibe, S. S. Chung, ShiJie Wen, Hironaru Yamaguchi, Yasuo Yahagi, Hideaki Kameyama, Shigehisa Yamamoto, Takashi Akioka:
Spreading Diversity in Multi-cell Neutron-Induced Upsets with Device Scaling. CICC 2006: 437-444
2005
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  - conf/icita/IbeKYY05
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Eishi Ibe, Hideaki Kameyama, Yasuo Yahagi, Hironaru Yamaguchi:
Single Event Effects as a Reliability Issue of IT Infrastructure. ICITA (1) 2005: 555-560

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