"Fault-based reliable design-on-upper-bound of electronic systems for ..."

Eishi Ibe et al. (2012)

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DOI: 10.1109/IOLTS.2012.6313840

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Eishi Ibe, Tadanobu Toba, Ken-ichi Shimbo, Hitoshi Taniguchi:
Fault-based reliable design-on-upper-bound of electronic systems for terrestrial radiation including muons, electrons, protons and low energy neutrons. IOLTS 2012: 49-54

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