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E. J. Geluk

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2024
[j2]
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  - journals/access/AbdiZBGWJ24
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  - https://dblp.org/rec/journals/access/AbdiZBGWJ24
Salim Abdi, Aleksandr Zozulia, Jeroen Bolk, E. J. Geluk, Kevin A. Williams, Yuqing Jiao:
High-Precision Mapping and Analysis of Wafer-Scale Distortions in InP Membranes to Si 3D Integration. IEEE Access 12: 92215-92226 (2024)
2006
[j1]
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Sanguan Anantathanasarn, Richard Nötzel, P. J. van Veldhoven, F. W. M. van Otten, Y. Barbarin, G. Servanton, Tjibbe de Vries, E. Smalbrugge, E. J. Geluk, T. J. Eijkemans:
Wavelength controlled InAs/InP quantum dots for telecom laser applications. Microelectron. J. 37(12): 1461-1467 (2006)

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