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A. Mieckowski

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2003
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C.-T. Wu, A. Mieckowski, R. S. Ridley, G. Dolny, T. Grebs, J. Linn, Jerzy Ruzyllo:
Effect of nitridation on the reliability of thick gate oxides. Microelectron. Reliab. 43(1): 43-47 (2003)

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