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M. Zeuner

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2003
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J. Kuchenbecker, Mattia Borgarino, M. Zeuner, U. König, Robert Plana, Fausto Fantini:
High Electric Field Induced Degradation of the DC Characteristics in Si/SiGe HEMT's. Microelectron. Reliab. 43(9-11): 1719-1723 (2003)

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