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"High Electric Field Induced Degradation of the DC Characteristics in ..."

J. Kuchenbecker et al. (2003)

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DOI: 10.1016/S0026-2714(03)00341-X

access: closed

type: Journal Article

metadata version: 2021-06-01

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  - journals/mr/KuchenbeckerBZKPF03
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  - https://dblp.org/rec/journals/mr/KuchenbeckerBZKPF03
J. Kuchenbecker, Mattia Borgarino, M. Zeuner, U. König, Robert Plana, Fausto Fantini:
High Electric Field Induced Degradation of the DC Characteristics in Si/SiGe HEMT's. Microelectron. Reliab. 43(9-11): 1719-1723 (2003)

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