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P. Verheyen

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Journal Articles

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2010
[j1]
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  - https://dblp.org/rec/journals/mr/Martin-MartinezAGVRNAS10
Javier Martín-Martínez, Esteve Amat, M. B. González, P. Verheyen, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich, Eddy Simoen:
SPICE modelling of hot-carrier degradation in Si_1-_xGe_x S/D and HfSiON based pMOS transistors. Microelectron. Reliab. 50(9-11): 1263-1266 (2010)

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