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Jae-Seong Jeong

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Journal Articles

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2017
[j13]
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Jae-Seong Jeong, Won-kyoung Lee, Chung-kuk Lee, Joongho Choi:
Lifetime and failure analysis of perovskite-based ceramic NTC thermistors by thermal cycling and abrasion combined stress. Microelectron. Reliab. 76-77: 112-116 (2017)
2016
[j12]
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Jae-Seong Jeong, Yong-Hyun Kim, Chang-kyun Park, Heon-Do Kim, Joongho Choi:
Effect of H/Ar treatment on ZnO: B transparent conducting oxide for flexible a-Si: H/μc-Si: H photovoltaic modules under damp heat stress. Microelectron. Reliab. 64: 640-645 (2016)
2015
[j11]
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Jae-Seong Jeong, Yong-Hyun Kim, Chang-kyun Park, Heon-Do Kim, Joongho Choi:
The degradation mechanism of flexible a-Si: H/μc-Si: H photovoltaic modules. Microelectron. Reliab. 55(9-10): 1804-1810 (2015)
2014
[j10]
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Nochang Park, Jae-Seong Jeong, Changwoon Han:
Estimation of the degradation rate of multi-crystalline silicon photovoltaic module under thermal cycling stress. Microelectron. Reliab. 54(8): 1562-1566 (2014)
2013
[j9]
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Jae-Seong Jeong:
Field failure mechanism and reproduction due to moisture for low-voltage ZnO varistors. Microelectron. Reliab. 53(9-11): 1632-1637 (2013)
2012
[j8]
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Jae-Seong Jeong:
Failure mechanism and reliability test method for USB interface circuitry on CPUs for mobile devices. Microelectron. Reliab. 52(9-10): 2014-2018 (2012)
[j7]
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Jae-Seong Jeong, Nochang Park, Changwoon Han:
Field failure mechanism study of solder interconnection for crystalline silicon photovoltaic module. Microelectron. Reliab. 52(9-10): 2326-2330 (2012)
2010
[j6]
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Jae-Seong Jeong, Young Jeon Kim:
Failure mechanism of COF based Line Driver IC for Flat Panel Display by contamination. Microelectron. Reliab. 50(9-11): 1488-1493 (2010)
2009
[j5]
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Jae-Seong Jeong, Sang-Deuk Park:
Failure analysis of video processor defined as No Fault Found (NFF): Reproduction in system level and advanced analysis technique in IC level. Microelectron. Reliab. 49(9-11): 1153-1157 (2009)
2008
[j4]
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Jae-Seong Jeong, Jin-Kyu Jung, Sang-Deuk Park:
Reliability improvement of InGaN LED backlight module by accelerated life test (ALT) and screen policy of potential leakage LED. Microelectron. Reliab. 48(8-9): 1216-1220 (2008)
2007
[j3]
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Jae-Seong Jeong, Soon-Ha Hong, Sang-Deuk Park:
Field failure mechanism and improvement of EOS failure of integrated IGBT inverter modules. Microelectron. Reliab. 47(9-11): 1795-1799 (2007)
2005
[j2]
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Jae-Seong Jeong, Jae-Hyun Lee, Jong-Shin Ha, Sang-Deuk Park:
Stress Mechanism about Field Lightning Surge of High Voltage BJT Based Line Driver for ADSL System. Microelectron. Reliab. 45(9-11): 1398-1401 (2005)
2004
[j1]
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Jae-Seong Jeong, Jong-Shin Ha, Sang-Deuk Park:
Field Failure Mechanism Investigation of GaAs based HBT Power Amplifier Mmodule (PAM). Microelectron. Reliab. 44(9-11): 1393-1398 (2004)

Conference and Workshop Papers

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2010
[c1]
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Jae-Seong Jeong, Soon Ghon Kim:
An Efficient Method for Game Development using Compiler. ICEIS (3) 2010: 447-450

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