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ORCIDMike W. T. Wong
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- affiliation: Hong Kong Polytechnic University, Hong Kong
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2000 – 2009
- 2004
[c14]Mike W. T. Wong, Yubin Zhang:
Design and Implementation of Self-Testable Full Range Window Comparator. Asian Test Symposium 2004: 314-318- 2003
- [c13]Mike W. T. Wong:
Issues Related to the Formulation of DFT Solution for Analog Circuit Test Using Equivalent Fault Analysis. Asian Test Symposium 2003: 120-123 - 2002
- [c12]K. Y. Ko, Mike W. T. Wong, Yim-Shu Lee:
Testing System-On-Chip by Summations of Cores? Test Output Voltages. Asian Test Symposium 2002: 350-355 - [c11]Mike W. T. Wong, K. Y. Ko, Yim-Shu Lee:
Analog and Mixed-Signal IP Cores Testing. DELTA 2002: 3-7 - [c10]Matthew Worsman, Mike W. T. Wong, Yim-Shu Lee:
Enhancing The Static D. C. Fault Diagnosis Of A Resistance Temperature Detector Sensor Circuit Using Equivalent Fault Analysis. DELTA 2002: 443-446 - 2001
- [c9]Matthew Worsman, Mike W. T. Wong, Yim-Shu Lee:
The use of equivalent fault analysis to improve static D.C. fault diagnosis - a potentiometric DAC case study. ETW 2001: 73-78 - 2000
- [j4]Matthew Worsman, Mike W. T. Wong:
Non‐linear analog circuit fault diagnosis with large change sensitivity. Int. J. Circuit Theory Appl. 28(3): 281-303 (2000) - [j3]Mike Wai-Tak Wong:
On the issues of oscillation test methodology. IEEE Trans. Instrum. Meas. 49(2): 240-245 (2000) - [c8]K. Y. Ko, Mike W. T. Wong:
New built-in self-test technique based on addition/subtraction of selected node voltages. Asian Test Symposium 2000: 39- - [c7]Matthew Worsman, Mike W. T. Wong, Yim-Shu Lee:
Analog circuit equivalent faults in the D.C. domain. Asian Test Symposium 2000: 84-89 - [c6]Matthew Worsman, Mike W. T. Wong, Yim-Shu Lee:
A Pre-Simulation Measure of D.C. Design-for-Testability Fault Diagnosis Quality. ISQED 2000: 361-368
1990 – 1999
- 1998
- [j2]Yingquan Zhou, Mike W. T. Wong, Yinghua Min:
On concurrent multiple error diagnosability in linear analog circuits using continuous checksum. Int. J. Circuit Theory Appl. 26(1): 53-64 (1998) - [c5]Mike W. T. Wong, Matthew Worsman:
DC Nonlinear Circuit Fault Simulation With Large Change Sensitivity. Asian Test Symposium 1998: 366-371 - [c4]Matthew Worsman, Mike W. T. Wong:
Nonlinear circuit fault diagnosis with large change sensitivity. ICECS 1998: 225-228 - 1997
- [c3]Joseph C. W. Pang, Mike W. T. Wong, Yim-Shu Lee:
Design and Implementation of Strongly Code-Disjoint CMOS Built-in Intermediate Voltage Sensor for Totally Self-Checking Circuits. Asian Test Symposium 1997: 82-87 - 1996
- [j1]Yingquan Zhou, Mike W. T. Wong, Yinghua Min:
Hardware reduction in continuous checksum-based analog checkers: Algorithm and its analysis. J. Electron. Test. 9(1-2): 153-163 (1996) - [c2]Tao Wei, Mike W. T. Wong, Yim-Shu Lee:
Efficient Multifrequency Analysis of Fault Diagnosis in Analog Circuits Based on Large Change Sensitivity Computation. Asian Test Symposium 1996: 232-237 - 1995
- [c1]Yingquan Zhou, Mike W. T. Wong, Yinghua Min:
Feasibility and Effectiveness of the Algorithm for Overhead Reduction in Analog Checkers. FTCS 1995: 238-247
Coauthor Index
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