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Yvan Maidon

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Journal Articles

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2005
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Yvan Maidon, Thomas Zimmer, André Ivanov:
An Analog Circuit Fault Characterization Methodology. J. Electron. Test. 21(2): 127-134 (2005)

Conference and Workshop Papers

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2001
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Dean Lewis, Hervé Lapuyade, Yann Deval, Yvan Maidon, Frédéric Darracq, Renaud Briand, Pascal Fouillat:
A New Laser System for X-Rays Flashes Sensitivity Evaluation. IOLTW 2001: 111-
2000
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Yvan Maidon, Yann Deval, Jean-Baptiste Bégueret:
An Improved CMOS BICS for On-Line Testing. IOLTW 2000: 100-

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