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M. Berkani Bouaroudj

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2011
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S. Pietranico, Stéphane Lefebvre, S. Pommier, M. Berkani Bouaroudj, S. Bontemps:
A study of the effect of degradation of the aluminium metallization layer in the case of power semiconductor devices. Microelectron. Reliab. 51(9-11): 1824-1829 (2011)

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