"A study of the effect of degradation of the aluminium metallization layer ..."

S. Pietranico et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.06.009

access: closed

type: Journal Article

metadata version: 2020-02-22

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S. Pietranico, Stéphane Lefebvre, S. Pommier, M. Berkani Bouaroudj, S. Bontemps:
A study of the effect of degradation of the aluminium metallization layer in the case of power semiconductor devices. Microelectron. Reliab. 51(9-11): 1824-1829 (2011)

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