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Philipp Riess

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2000 – 2009

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2009
[j1]
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  - journals/mr/IlleSPGBERACGB09
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  - https://dblp.org/rec/journals/mr/IlleSPGBERACGB09
Adrien Ille, Wolfgang Stadler, Thomas Pompl, Harald Gossner, Tilo Brodbeck, Kai Esmark, Philipp Riess, David Alvarez, Kiran V. Chatty, Robert Gauthier, Alain Bravaix:
Reliability aspects of gate oxide under ESD pulse stress. Microelectron. Reliab. 49(12): 1407-1416 (2009)
2006
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  - conf/iscas/KropfitschRKD06
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Michael Kropfitsch, Philipp Riess, Gerhard Knoblinger, Dieter Draxelmayr:
Dielectric absorption of low-k materials: extraction, modelling and influence on SAR ADCs. ISCAS 2006

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