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Nishath K. Verghese
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2000 – 2009
- 2006
- [j5]Ali Afzali-Kusha, Makoto Nagata, Nishath K. Verghese, David J. Allstot:
Substrate Noise Coupling in SoC Design: Modeling, Avoidance, and Validation. Proc. IEEE 94(12): 2109-2138 (2006) - 2004
- [c6]Igor Keller, Ken Tseng, Nishath K. Verghese:
A robust cell-level crosstalk delay change analysis. ICCAD 2004: 147-154 - [c5]Ajit Sharma, Chenggang Xu, Wen Kung Chu, Nishath K. Verghese, Terri S. Fiez, Kartikeya Mayaram:
A predictive methodology for accurate substrate parasitic extraction. ISCAS (5) 2004: 149-152 - 2003
- [c4]Wen Kung Chu, Nishath K. Verghese, Heayn-Jun Chol, Kenji Shimazaki, Hiroyuki Tsujikawa, Shouzou Hirano, Shirou Doushoh, Makoto Nagata, Atsushi Iwata, Takafumi Ohmoto:
A substrate noise analysis methodology for large-scale mixed-signal ICs. CICC 2003: 369-372
1990 – 1999
- 1998
- [j4]Nishath K. Verghese, David J. Allstot:
Computer-aided design considerations for mixed-signal coupling in RF integrated circuits. IEEE J. Solid State Circuits 33(3): 314-323 (1998) - [j3]Sayfe Kiaei, David J. Allstot, Ken Hansen, Nishath K. Verghese:
Noise considerations for mixed-signal RF IC transceivers. Wirel. Networks 4(1): 41-53 (1998) - 1996
- [j2]Nishath K. Verghese, David J. Allstot, Mark A. Wolfe:
Verification techniques for substrate coupling and their application to mixed-signal IC design. IEEE J. Solid State Circuits 31(3): 354-365 (1996) - 1995
- [c3]Nishath K. Verghese, David J. Allstot:
SUBTRACT: a program for the efficient evaluation of substrate parasitics in integrated circuits. ICCAD 1995: 194-198 - [c2]Nishath K. Verghese, David J. Allstot:
A Macromodel Compaction Scheme for the Fast Stimulation of Large Linear Mesh Circuits. ISCAS 1995: 1836-1839 - 1994
- [j1]Balsha R. Stanisic, Nishath K. Verghese, Rob A. Rutenbar, L. Richard Carley, David J. Allstot:
Addressing substrate coupling in mixed-mode ICs: simulation and power distribution synthesis. IEEE J. Solid State Circuits 29(3): 226-238 (1994) - 1993
- [c1]Nishath K. Verghese, Sang-Soo Lee, David J. Allstot:
A unified approach to simulating electrical and thermal substrate coupling interactions in ICs. ICCAD 1993: 422-426
Coauthor Index
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