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Jean Guastavino

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Journal Articles

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2008
[j3]
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A. Belarni, Mohamed Lamhamdi, Patrick Pons, Laurent Boudou, Jean Guastavino, Y. Segui, George J. Papaioannou, Robert Plana:
Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches. Microelectron. Reliab. 48(8-9): 1232-1236 (2008)
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Mohamed Lamhamdi, Patrick Pons, Usama Zaghloul, Laurent Boudou, Fabio Coccetti, Jean Guastavino, Y. Segui, George J. Papaioannou, Robert Plana:
Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation. Microelectron. Reliab. 48(8-9): 1248-1252 (2008)
2006
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Mohamed Lamhamdi, Jean Guastavino, Laurent Boudou, Y. Segui, Patrick Pons, Laurent Bouscayrol, Robert Plana:
Charging-Effects in RF capacitive switches influence of insulating layers composition. Microelectron. Reliab. 46(9-11): 1700-1704 (2006)

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