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ORCIDMohamed Lamhamdi
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2020 – today
- 2021
[j7]Hajar Baghdadi, Mohamed Massour el Aoud, Ismail Lagrat
, Karim Rhofir, Noureddine Elbarbri, Mohamed Lamhamdi:
Remote Laboratory in Control Process during COVID-19 Pandemic Situation. Int. J. Online Biomed. Eng. 17(10): 4 (2021)
2000 – 2009
- 2008
- [b1]Mohamed Lamhamdi:
Développement d'outils d'analyse des matériaux pour l'étude du chargement des diélectriques: application à la fiabilité des micro-commutateurs RF à actionnement éléctrostatique. Paul Sabatier University, Toulouse, France, 2008 - [j6]A. Belarni, Mohamed Lamhamdi, Patrick Pons, Laurent Boudou, Jean Guastavino, Y. Segui, George J. Papaioannou, Robert Plana:
Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches. Microelectron. Reliab. 48(8-9): 1232-1236 (2008) - [j5]Jinyu Jason Ruan, E. Papandreou, Mohamed Lamhamdi, Matroni Koutsoureli, Fabio Coccetti, Patrick Pons, George J. Papaioannou, Robert Plana:
Alpha particle radiation effects in RF MEMS capacitive switches. Microelectron. Reliab. 48(8-9): 1241-1244 (2008) - [j4]Mohamed Lamhamdi, Patrick Pons, Usama Zaghloul, Laurent Boudou, Fabio Coccetti, Jean Guastavino, Y. Segui, George J. Papaioannou, Robert Plana:
Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation. Microelectron. Reliab. 48(8-9): 1248-1252 (2008) - 2007
- [j3]E. Papandreou, Mohamed Lamhamdi, C. M. Skoulikidou, Patrick Pons, George J. Papaioannou, Robert Plana:
Structure dependent charging process in RF MEMS capacitive switches. Microelectron. Reliab. 47(9-11): 1812-1817 (2007) - 2006
- [j2]M. A. Exarchos, E. Papandreou, Patrick Pons, Mohamed Lamhamdi, George J. Papaioannou, Robert Plana:
Charging of radiation induced defects in RF MEMS dielectric films. Microelectron. Reliab. 46(9-11): 1695-1699 (2006) - [j1]Mohamed Lamhamdi, Jean Guastavino, Laurent Boudou, Y. Segui, Patrick Pons, Laurent Bouscayrol, Robert Plana:
Charging-Effects in RF capacitive switches influence of insulating layers composition. Microelectron. Reliab. 46(9-11): 1700-1704 (2006)
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