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K. Miyahara

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2000 – 2009

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2001
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M. Nakabayashi, Hidenori Ohyama, Eddy Simoen, M. Ikegami, Cor Claeys, K. Kobayashi, M. Yoneoka, K. Miyahara:
Reliability of polycrystalline silicon thin film resistors. Microelectron. Reliab. 41(9-10): 1341-1346 (2001)

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