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Edward I. Cole Jr.

Edward I. Cole

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2020 – today

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2020
[c5]
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  dblp key:
  - conf/irps/MillerCKR20
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Mary A. Miller, Edward I. Cole, Garth M. Kraus, Perry J. Robertson:
At-Speed Defect Localization by Combining Laser Scanning Microscopy and Power Spectrum Analysis. IRPS 2020: 1-5

2010 – 2019

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2016
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  - conf/host/HelinskiCRWP16
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Ryan L. Helinski, Edward I. Cole, Gideon Robertson, Jonathan Woodbridge, Lyndon G. Pierson:
Electronic forensic techniques for manufacturer attribution. HOST 2016: 139-144

2000 – 2009

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2008
[c3]
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  - conf/cicc/Cole08
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Edward I. Cole Jr.:
Non-destructive IC defect localization using optical beam-based imaging. CICC 2008: 53-56
2004
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Edward I. Cole Jr.:
Global Failure Localization: We Have To, But on What and How? ITC 2004: 1440
2001
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Edward I. Cole Jr.:
Global fault localization using induced voltage alteration. Microelectron. Reliab. 41(8): 1145-1159 (2001)

1990 – 1999

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1997
[c1]
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  - conf/itc/ColeSTCBBHH97
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Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins:
Transient Power Supply Voltage (V_DDT) Analysis for Detecting IC Defects. ITC 1997: 23-31

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