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Edward I. Cole Jr.

Edward I. Cole

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Journal Articles

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2001
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Edward I. Cole Jr.:
Global fault localization using induced voltage alteration. Microelectron. Reliab. 41(8): 1145-1159 (2001)

Conference and Workshop Papers

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2020
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Mary A. Miller, Edward I. Cole, Garth M. Kraus, Perry J. Robertson:
At-Speed Defect Localization by Combining Laser Scanning Microscopy and Power Spectrum Analysis. IRPS 2020: 1-5
2016
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Ryan L. Helinski, Edward I. Cole, Gideon Robertson, Jonathan Woodbridge, Lyndon G. Pierson:
Electronic forensic techniques for manufacturer attribution. HOST 2016: 139-144
2008
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Edward I. Cole Jr.:
Non-destructive IC defect localization using optical beam-based imaging. CICC 2008: 53-56
2004
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Edward I. Cole Jr.:
Global Failure Localization: We Have To, But on What and How? ITC 2004: 1440
1997
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Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins:
Transient Power Supply Voltage (V_DDT) Analysis for Detecting IC Defects. ITC 1997: 23-31

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