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Allen H. Taber

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Journal Articles

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1996
[j2]
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  - journals/ibmrd/ZieglerCMMCNRWFHLWOUROMSSYETSTSKW96
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James F. Ziegler, Huntington W. Curtis, Hans P. Muhlfeld, Charles J. Montrose, B. Chin, Michael Nicewicz, C. A. Russell, Wen Y. Wang, Leo B. Freeman, P. Hosier, L. E. LaFave, James L. Walsh, José M. Orro, G. J. Unger, John M. Ross, Timothy J. O'Gorman, B. Messina, Timothy D. Sullivan, A. J. Sykes, Hannon S. Yourke, Thomas A. Enger, Vikram R. Tolat, T. S. Scott, Allen H. Taber, R. J. Sussman, W. A. Klein, C. W. Wahaus:
IBM experiments in soft fails in computer electronics (1978-1994). IBM J. Res. Dev. 40(1): 3-18 (1996)
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Timothy J. O'Gorman, John M. Ross, Allen H. Taber, James F. Ziegler, Hans P. Muhlfeld, Charles J. Montrose, Huntington W. Curtis, James L. Walsh:
Field testing for cosmic ray soft errors in semiconductor memories. IBM J. Res. Dev. 40(1): 41-50 (1996)

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